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Simmons J.P., Drummy L.F., Bouman C.A., De Graef M. Statistical Methods for Materials Science: The Data Science of Microstructure Characterization

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Simmons J.P., Drummy L.F., Bouman C.A., De Graef M. Statistical Methods for Materials Science: The Data Science of Microstructure Characterization
CRC Press, Taylor & Francis Group, 2019. — 537 p. — ISBN13: 978-1-4987-3820-0.
Data analytics has become an integral part of materials science. This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling. Additionally, the Read more...
Abstract: Data analytics has become an integral part of materials science. This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling. Additionally, the analysis and applications section addresses compressed sensing methods, stochastic models, extreme estimation, and approaches to pattern detection.
Materials Science vs. Data Science
Emerging Data Science in Microstructure Characterization
Emerging Digital Data Capabilities
Cultural Differences
Forward Modeling
Inverse Problems and Sensing
Inverse Methods for Analysis of Data
Model-Based Iterative Reconstruction for Electron Tomography
Statistical Reconstruction and Heterogeneity Characterization in 3-D Biological Macromolecular Complexes
Object Tracking through Image Sequences
Structure Formation in Materials
Grain Boundary Characteristics
Interface Science and the Formation of Structure
Hierarchical Assembled Structures from Nanoparticles
Microstructure
Estimating Orientation Statistics
Representation of Stochastic Microstructures
Computer Vision for Microstructure Representation
Topological Analysis of Local Structure
Markov Random Fields for Microstructure Simulation
Distance Measures for Microstructures
Industrial Applications
Anomalies
Anomaly Testing
Anomalies in Microstructures
Sparse Methods
Denoising Methods with Applications to Microscopy
Compressed Sensing for Imaging Applications
Dictionary Methods for Compressed Sensing
Sparse Sampling in Microscopy
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