New York: McGraw-Hil, 1999. — 734 p. This book tries to capture the major topics that fall under the umbrella of "Variation Management." The book is laid out so that the reader can easily understand the variation management process and how each chapter maps to this process. This book has two purposes. It is a"one-step" resource for people who want to know everything about...
ISTE Ltd., John Wiley & Sons, Inc., 2011. — 677 p. — ISBN: 978-1-84821-188-9. Applied Metrology for Manufacturing Engineering, stands out from traditional works due to its educational aspect. Illustrated by tutorials and laboratory models, it is accessible to users of non-specialists in the fields of design and manufacturing. Chapters can be viewed independently of each other...