Kumar C.S.S.R. (Ed.) Surface Science Tools for Nanomaterials Characterization

Springer-Verlag, Berlin, Heidelberg, 2015. – 653 p. – ISBN10: 3662445506This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application
Scanning Probe Microscopy for Nanolithography
Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
Field Ion Microscopy for the Characterization of Scanning Probes
Scanning Conductive Torsion Mode Microscopy
Field Ion and Field Desorption Microscopy: Principles and Applications
Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials
Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy
Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
Higher Resolution Scanning Probe Methods for Magnetic Imaging
Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy
Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures
High Resolution STM Imaging
Numerical and Finite Element Simulations of Nanotips for FIM/FEM