Wang Z.M. (Ed.) FIB Nanostructures

Springer International Publishing, Switzerland, 2013. – 536 p. – ISBN: 978-3-319-02873-6The focused ion beam (FIB) has become one of the most popular tools enabling scientifi c and technological advances in the creation and characterization of objects at the nanometer scale. In many respects, the importance of FIB to nanoscience and nanotechnology is comparable to the scanning tunneling microscope (STM). While STM is considered to be the eyes and hands of needed scientists to manipulate atoms and molecules, the dual-beam or other advanced FIB confi gurations allow scientists not only to fabricate various nanostructures with a powerful “hand” holding a “drill” but also to “see” nanoscale fabricating processes in real time. These capabilities have allowed FIB nanostructures to fi nd a wide spectrum of applications in areas ranging from the microelectronic industry and materials science to biology and medicine. The fabrication of FIB nanostructures, their applications, and special features are extensively covered in this book with 19 chapters by 60 authors from 12 countriesFocused Ion Beam (FIB) Technology for Micro- and Nanoscale Fabrications
Epitaxial Ferroelectric Nanostructures Fabricated by FIB Milling
Low-Current Focused Ion Beam Milling for Freestanding Nanomaterial Characterization
Focused Ion Beam Milling of Carbon Nanotube Yarns and Bucky-Papers: Correlating Their Internal Structure with Their Macro-Properties
Nanoscale Electrical Contacts Grown by Focused Ion Beam (FIB)-Induced Deposition
Metal-Induced Crystallization of Focused Ion Beam-Induced Deposition for Functional Patterned
Ultrathin Nanocarbon
Deterministic Fabrication of Micro- and Nanostructures by Focused Ion Beam
Application of Ion Beam Processes to Scanning Probe Microscopy
Fabrication of Needle-Shaped Specimens Containing Subsurface Nanostructures for Electron Tomography
Fabrication Technique of Deformation Carriers (Gratings and Speckle Patterns) with FIB for Microscale/Nanoscale Deformation Measurement
Controlled Quantum Dot Formation on Focused Ion Beam-Patterned GaAs Substrates
Development of Functional Metallic Glassy Materials by FIB and Nanoimprint Technologies
Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrodes Patterned by Focused Ion Beam
Focused Ion Beam-Assisted Nanoscale Processing and Thermoelectrical Characterization
FIB Design for Nanofl uidic Applications
FIB Patterning of Stainless Steel for the Development of Nano-structured Stent Surfaces
for Cardiovascular Applications
Evaluation of Damages Induced by Ga+-Focused Ion Beam in Piezoelectric Nanostructures
Instabilities in Focused Ion-Beam-Patterned Nanostructures
Nanostructures by Mass-Separated FIB